| Title: | NANOSCALE CALIBRATION STANDARDS AND METHODS : Dimensional and related measurements in the micro- and nanometer range |
| Authors: | Günter Wilkening, Editor ; Ludger Koenders, Editor |
| Material Type: | printed text |
| Publisher: | Weinheim : Wiley/VCH, 2005 |
| ISBN (or other code): | 978-3-527-40502-2 |
| Size: | xxii-519 p. / 25 cm |
| Langues : | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Instrumentation , Nanoscale , Nanostructure , Scanning tunneling microscopy , Surface physics |
Exemplaires (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 008185 | TECH1 WIL | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
