| Title: | ADVANCES IN X-RAY ANALYSIS : Volume 1. Proceedings of the sixth annual conference on applications of x-ray analysis held August 7-9, 1957 |
| Authors: | William M. Mueller, Editor |
| Material Type: | printed text |
| Publisher: | New York NY : Plenum Press, 1960 |
| Series: | Advances in X-Ray Analysis, num. 1 |
| Size: | 494 p. / 24 cm |
| Langues : | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Diffraction , Instrumentation , Spectrometer , Spectroscopy , X-ray spectroscopy , X-rays |
Exemplaires (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 000552 | TECH2 AXR/S | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
