| Title: | EXAFS : Basic principles and data analysis. With 88 figures and 17 tables |
| Authors: | Boon K. Teo, Author |
| Material Type: | printed text |
| Publisher: | Berlin : Springer-Verlag, 1986 |
| Series: | Inorganic Chemistry Concepts, num. 9 |
| ISBN (or other code): | 978-3-540-15833-2 |
| Size: | xviii-349 p. / 25 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Data analysis , Electrons , Scattering , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 009674 | TECH2 TEO | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
