| Title: | PRACTICAL ELECTRON MICROSCOPY OF LATTICE DEFECTS |
| Authors: | Hiroyasu Saka, Author |
| Material Type: | printed text |
| Publisher: | New Jersey NJ : World Scientific, 2021 |
| ISBN (or other code): | 978-981-1234699-- |
| Size: | xiv-294 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Crystallography , Crystals , Defects , Dislocations , Electron microscopy |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 009606 | TECH2 SAK | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
