| Title: | FIELD EMISSION SCANNING ELECTRON MICROSCOPY : New perspectives for materials characterization |
| Authors: | Nicolas Brodusch, Author ; Hendrix Demers, Author ; Raynald Gauvin, Author |
| Material Type: | printed text |
| Publisher: | Singapore : Springer, 2018 |
| Series: | Springer Briefs in Applied Sciences and Technology |
| ISBN (or other code): | 978-981-10-4432-8 |
| Size: | xii-137 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Electron diffraction , Scanning electron microscope |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 009605 | TECH2 BRO | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
