| Title: | HIGH RESOLUTION X-RAY DIFFRACTOMETRY AND TOPOGRAPHY |
| Authors: | D. Keith Bowen, Author ; Brian K. Tanner |
| Material Type: | printed text |
| Publisher: | LONDON : Taylor & Francis, 1998 |
| ISBN (or other code): | 978-0-85066-758-5 |
| Size: | x-252 p. / 25 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Diffraction , Scattering , Thin films , Topography , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 008964 | TECH2 BOW | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
