| Title: | THIN FILM ANALYSIS BY X-RAY SCATTERING |
| Authors: | Mario Birkholz, Author ; Paul F. Fewster ; Christoph Genzel |
| Material Type: | printed text |
| Publisher: | Weinheim : Wiley/VCH, 2006 |
| ISBN (or other code): | 978-3-527-31052-4 |
| Size: | xxii-356 p. / 25 cm |
| Languages: | English |
| Class number: | PMC (PHYSIQUE DU SOLIDE) |
| Keywords | Diffraction , Thin films , X-ray spectroscopy , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 008875 | PMC13 BIR | papier | CNRS | PMC (PHYSIQUE DU SOLIDE) | Available |
