| Title: | IN-SITU MICROSCOPY IN MATERIALS RESEARCH : Leading international research in electron and scanning probe microscopies |
| Authors: | Pratibha L. Gai, Editor |
| Material Type: | printed text |
| Publisher: | Boston MA : Kluwer Academic Publishers, 1997 |
| ISBN (or other code): | 978-0-7923-9989-6 |
| Size: | xviii-336 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Electron microscopy , Materials science , Microscopy , Scanning tunneling microscopy |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 008553 | TECH2 GAI | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
