| Title: | MODERN DEVELOPMENTS IN ELECTRON MICROSCOPY |
| Authors: | Benjamin M. Siegel, Editor |
| Material Type: | printed text |
| Publisher: | New York NY : Academic Press, 1964 |
| Size: | xiv-432 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Electron microscopy , Materials |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 008106 | TECH2 SIE | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
