| Title: | OPTICAL CHARACTERIZATION OF EPITAXIAL SEMICONDUCTOR LAYERS : With 271 figures |
| Authors: | Günther Bauer, Editor ; Wolfgang Richter, Editor |
| Material Type: | printed text |
| Publisher: | Berlin : Springer, 1996 |
| ISBN (or other code): | 978-3-540-59129-0 |
| Size: | xiv-427 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Crystal growth , Epitaxy , Optical properties , Semiconductors |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 007972 | TECH2 BAU | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
