| Title: | HIGH-RESOLUTION X-RAY SCATTERING : From thin films to lateral nanostructures. Second edition. With 240 figures |
| Authors: | Ullrich Pietsch, Author ; Vaclav Holy ; Tilo Baumbach |
| Material Type: | printed text |
| Edition statement: | 2nd ed. |
| Publisher: | New York NY : Springer, 2004 |
| Series: | Advanced Texts in Physics |
| ISBN (or other code): | 978-0-387-40092-1 |
| Size: | xvi-408 p. / 24 cm |
| Languages: | English |
| Class number: | PMC (PHYSIQUE DU SOLIDE) |
| Keywords | Diffraction , Nanoparticles , Scattering , Thin films , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 007714 | PMC2 PIE | papier | CNRS | PMC (PHYSIQUE DU SOLIDE) | Available |
