| Title: | ANOMALOUS X-RAY SCATTERING FOR MATERIALS CHARACTERIZATION : Atomic-scale structure determination. With 132 figures |
| Authors: | Yoshio Waseda, Author |
| Material Type: | printed text |
| Publisher: | Berlin : Springer, 2002 |
| Series: | Springer Tracts in Modern Physics, num. 179 |
| ISBN (or other code): | 978-3-540-43443-6 |
| Size: | xxiv-214 p. / 24 cm |
| Languages: | English |
| Class number: | PMC (PHYSIQUE DU SOLIDE) |
| Keywords | Anomalous scattering , Structure , X-ray spectroscopy , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 007392 | PMC2 STM/S | papier | CNRS | PMC (PHYSIQUE DU SOLIDE) | Available |
