| Title: | DIRECT OBSERVATION OF IMPERFECTIONS IN CRYSTALS : Proceedings of a Technical Conference held in St. Louis, Missouri, March 1-2, 1961 |
| Authors: | John B. Newkirk, Editor ; J. H. Wernick, Editor |
| Material Type: | printed text |
| Publisher: | New York NY : Interscience Publishers, 1962 |
| Size: | xii-617 p. / 24 cm |
| Langues : | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Defects , Dislocations , Microscopy , Topography |
Exemplaires (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 000686 | TECH2 NEW/C | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
