| Title: | ELECTRICAL PHENOMENA AT INTERFACES : Fundamentals, measurements, and applications. Second edition, revised and expanded |
| Authors: | Hiroyuki Ohshima, Editor ; Kunio Furusawa |
| Material Type: | printed text |
| Edition statement: | 2nd ed. |
| Publisher: | New York NY : Marcel Dekker, 1998 |
| Series: | Surfactant Science Series, num. 76 |
| ISBN (or other code): | 978-0-8247-9039-4 |
| Size: | xiv-628 p. / 26 cm |
| Languages: | English |
| Class number: | PMC (PHYSIQUE DU SOLIDE) |
| Keywords | Interfaces , Surface chemistry |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 007112 | PMC12 OHS | papier | CNRS | PMC (PHYSIQUE DU SOLIDE) | Available |
