| Title: | TRANSMISSION ELECTRON MICROSCOPY : Physics of Image Formation and Microanalysis |
| Authors: | Ludwig Reimer, Author |
| Material Type: | printed text |
| Edition statement: | 3rd ed. |
| Publisher: | Berlin : Springer-Verlag, 1993 |
| Series: | Springer Series in Optical Sciences, num. 36 |
| ISBN (or other code): | 978-3-540-56849-0 |
| Size: | 545 p. / 24 cm |
| Langues : | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Electron diffraction , Electron microscopy |
Exemplaires (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 006770 PERDU | TECH2 REI | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Not for loan |
