| Title: | ADVANCES IN X-RAY ANALYSIS : Volume 36 |
| Authors: | John V. Gilfrich, Author ; Camden R. Hubbard ; Ron Jenkins ; Deane K. Smith ; Ting C. Huang ; Michael R. James ; Gerald R. Lachance ; Paul K. Predecki ; Applications of X-r (03-07/08/92; Colorado Springs, US) |
| Material Type: | printed text |
| Publisher: | New York NY : Plenum Press, 1993 |
| Series: | Advances in X-Ray Analysis, num. 36 |
| ISBN (or other code): | 0-306-44571-19 |
| Size: | 685 p. / 26 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Diffraction , Instrumentation , Spectrometer , Spectroscopy , X-ray spectroscopy , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 006724 | TECH2 AXR/S | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
