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Title:
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ADVANCES IN X-RAY ANALYSIS : Volume 6. Proceedings of the eleventh annual conference on applications of x-ray analysis held August 8-10, 1962
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Authors:
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William M. Mueller, Editor ;
Marie Fay, Editor
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Material Type:
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printed text
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Publisher:
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New York NY : Plenum Press, 1963
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Series:
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Advances in X-Ray Analysis, num. 6
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Size:
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xii-480 p. / 24 cm
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Languages:
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English
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Class number:
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TECH (TECHNIQUES ET INSTRUMENTATION)
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Keywords
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Diffraction
,
Instrumentation
,
Spectrometer
,
Spectroscopy
,
X-ray spectroscopy
,
X-rays
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