| Title: | ADVANCES IN X-RAY ANALYSIS : Volume 2. Proceedings of the seventh annual conference on applications of x-ray analysis held August 13-15, 1958 |
| Authors: | William M. Mueller, Editor |
| Material Type: | printed text |
| Publisher: | New York NY : Plenum Press, 1960 |
| Series: | Advances in X-Ray Analysis, num. 2 |
| Size: | 359 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Diffraction , Instrumentation , Spectrometer , Spectroscopy , X-ray spectroscopy , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 000553 | TECH2 AXR/S | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
