Title: | EXAMINING THE SUBMICRON WORLD : Proceedings of a NATO ASI on Improved Methods for Examining the Submicron World, Canada 1984 |
Authors: | Ralph Feder, Author ; J. Wm. Mc Gowan ; Douglas M. Shinozaki ; Examining submicron (1984-28/07-11/08; Nova Scotia, CAN) |
Material Type: | printed text |
Publisher: | New York NY : Plenum Press, 1986 |
Series: | NATO ASI Series. Series B : Physics, num. B137 |
ISBN (or other code): | 978-0-306-42278-2 |
Size: | 372 p. / 26 cm |
Languages: | English |
Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
Keywords | Electron microscopy , Microscopy , Spectroscopy , Synchrotron , X-rays |
Copies (1)
Barcode | Call number | Media type | Location | Section | Status | Commentaire |
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005936 | TECH2 ASI/C/S | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |