| Title: | POINT DEFECTS IN SEMICONDUCTORS II : Experimental Aspects |
| Authors: | Jacques Bourgoin, Author ; M. Lannoo |
| Material Type: | printed text |
| Publisher: | Berlin : Springer-Verlag, 1983 |
| Series: | Springer Series in Solid State Sciences, num. 35 |
| ISBN (or other code): | 978-3-540-11515-1 |
| Size: | 296 p. / 24 cm |
| Languages: | English |
| Class number: | PMC (PHYSIQUE DU SOLIDE) |
| Keywords | Defects , Physical characterisation , Semiconductors , Spectroscopy , Transport |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 005878 | PMC8 SSS/S | papier | CNRS | PMC (PHYSIQUE DU SOLIDE) | Available |
