| Title: | ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS |
| Authors: | D.e. Newbury, Author ; D.c. Joy ; P. Echlin ; C.e. Fiori ; J.i. Goldstein |
| Material Type: | printed text |
| Publisher: | New York NY : Plenum Press, 1986 |
| ISBN (or other code): | 978-0-306-42140-2 |
| Size: | 454 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Chemical analysis , Electron microscopy , Microanalysis , Scanning electron microscope , X-ray microanalysis , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 005846 | TECH2 NEW | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
