| Title: | SURFACE CRYSTALLOGRAPHY BY LEED : Theory, Computation and Structural Results |
| Authors: | M.a. Van Hove, Author ; S.y. Tong |
| Material Type: | printed text |
| Publisher: | Berlin : Springer-Verlag, 1979 |
| Series: | Springer Series in Chemical Physics, num. 2 |
| ISBN (or other code): | 978-3-540-09194-3 |
| Size: | 286 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Electron diffraction , LEED , Low energy electron diffraction , Surface |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 004507 | TECH2 VAN | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
