| Title: | DIFFRACTION AND IMAGING TECHNIQUES IN MATERIAL SCIENCE : Volume II. Imaging and Diffraction Techniques |
| Authors: | S. Amelinckx, Author ; R. Gevers ; J. Van Landuyt |
| Material Type: | printed text |
| Edition statement: | 2nd ed. |
| Publisher: | Amsterdam : North-Holland, 1978 |
| ISBN (or other code): | 978-0-444-85129-1 |
| Size: | 847-XVII p. / 23 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Diffraction , Electron microscopy |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 004419 PERDU | TECH2 AME | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Not for loan |
