Title: | ADVANCES IN X-RAY ANALYSIS : Volume 21 |
Authors: | John B. Newkirk, Author ; Clayton O. Ruud, Author ; Charles S. Barrett, Author ; Donald E. Leyden, Author ; Applications of X-ra (3-5/08/77; Denver) |
Material Type: | printed text |
Publisher: | New York NY : Plenum Press, 1978 |
Series: | Advances in X-Ray Analysis, num. 21 |
ISBN (or other code): | 978-0-306-38421-9 |
Size: | 325 p. / 24 cm |
Languages: | English |
Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
Keywords | Diffraction , Instrumentation , Spectrometer , Spectroscopy , X-ray spectroscopy , X-rays |
Copies (1)
Barcode | Call number | Media type | Location | Section | Status | Commentaire |
---|---|---|---|---|---|---|
004400 | TECH2 AXR/S | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |