| Title: | MICROSCOPY OF MATERIAL : Modern Imaging Methods Using Electron, X-Ray and Ion Beams |
| Authors: | D. K. Bowen, Author ; C. R. Hall |
| Material Type: | printed text |
| Publisher: | New York NY : Macmillan, 1975 |
| Size: | 304 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Chemical analysis , Microscopy , Topography , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 003278 | TECH2 BOW | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
