| Title: | PRACTICAL SCANNING ELECTRON MICROSCOPY : Electron and ion microprobe analysis. Foreword by T.E. Everhart |
| Authors: | J.i. Goldstein, Editor ; H. Yakowitz, Editor |
| Material Type: | printed text |
| Publisher: | New York NY : Plenum Press, 1975 |
| ISBN (or other code): | 978-0-306-30820-8 |
| Size: | xviii-582 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Electron microscopy , Scanning electron microscope |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 003181 | TECH2 GOL | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
