| Title: | ELLIPSOMETRY : Proceedings of the 3rd International Conference on Ellipsometry, 1975 |
| Authors: | N.m. Bashara, Author ; R.m.a. Azzam ; Ellipsometry (1975-09-23/25; Univ. of Nebraska,NE) |
| Material Type: | printed text |
| Publisher: | Amsterdam : North-Holland, 1976 |
| ISBN (or other code): | 978-0-7204-0493-7 |
| Size: | 518 p. / 25 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Experimental methods , Interferometry , Polarization , Spectrometer , Surface , Thin films |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 003175 | TECH2 BAS/C | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
