| Title: | ADVANCES IN X-RAY ANALYSIS : Volume 15 |
| Authors: | John B. Newkirk, Author ; Clayton O. Ruud, Author ; Charles S. Barrett, Author ; Applications of X-ra (11-13/08/71; Denver) |
| Material Type: | printed text |
| Publisher: | New York NY : Plenum Press, 1972 |
| Series: | Advances in X-Ray Analysis, num. 15 |
| ISBN (or other code): | 306-38115-X |
| Size: | 573 p. / 24 cm |
| Languages: | English |
| Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
| Keywords | Diffraction , Instrumentation , Spectrometer , Spectroscopy , X-ray spectroscopy , X-rays |
Copies (1)
| Barcode | Call number | Media type | Location | Section | Status | Commentaire |
|---|---|---|---|---|---|---|
| 001807 | TECH2 AXR/S | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |
