Title: | ADVANCES IN X-RAY ANALYSIS : Volume 13 |
Authors: | Burton L. Henke, Author ; John B. Newkirk, Author ; Gavin R. Mallett, Author ; Applications of X-ra (6-8/08/69; Denver) |
Material Type: | printed text |
Publisher: | New York NY : Plenum Press, 1970 |
Series: | Advances in X-Ray Analysis, num. 13 |
ISBN (or other code): | 306-38113-3 |
Size: | 681 p. / 24 cm |
Languages: | English |
Class number: | TECH (TECHNIQUES ET INSTRUMENTATION) |
Keywords | Diffraction , Instrumentation , Spectrometer , Spectroscopy , X-ray spectroscopy , X-rays |
Copies (1)
Barcode | Call number | Media type | Location | Section | Status | Commentaire |
---|---|---|---|---|---|---|
001805 | TECH2 AXR/S | papier | CNRS | TECH (TECHNIQUES ET INSTRUMENTATION) | Available |